Design for Test
For seamless implementation and cost efficiency, our approach ensures that plan details are optimized upfront, eliminating the need for additional configuration changes or further investments in time and resources.
At Terusemitech, our Design for Test (DFT) services are built on deep technical expertise and hands-on experience. We collaborate closely with clients, offering a comprehensive suite of DFT solutions—from DFT architecture to post-silicon support. With a proven track record across various work modes, our team excels in deploying sophisticated methodologies and leveraging cutting-edge EDA tools to ensure highly efficient, scalable, and high-performance designs.
Our Service Offerings
At Terusemitech, our Design for Test (DFT) services are structured to optimize testing efficiency, enhance fault coverage, and ensure seamless silicon bring-up while reducing overall design complexities and costs.
DFT Architecture and Implementation
- Flow and Methodology Development for streamlined DFT integration
DFT Validation
- Gate-Level and RTL Simulations for DFT validation
- Analog BIST Simulations ensuring functional integrity of mixed-signal designs
IO Testing using JTAG/BSCAN Implementation
- JTAG/BSCAN-Based IO Testing ensuring compliance with IEEE 1149.1 & IEEE 1149.6 standards
- Boundary Scan Implementation at SoC Level for robust structural test coverage
Memory Testing using MBIST Implementation
- MBIST Implementation with and without repair
- Simulation and Debug at Timing and No-timing Simulations
ATPG Pattern Generation for Different Fault Models
- Automated Test Pattern Generation (ATPG) for multiple fault models: Stuck-at, Transition, Bridging, and Cell-aware faults
- Extensive Fault Coverage Analysis at Block and SoC levels
- Low Power Pattern Generation with Test Point Insertion (TPI) Analysis for optimization
- Pattern Retargeting at SoC Level to enhance reusability and test efficiency
Scan Implementation with and without Compression
- Hierarchical and Flat Scan Implementation for designs ranging from small-scale to multi-million gate architectures
- Scan Insertion with and without Compression to improve test coverage and efficiency
- Logic Built-In Self-Test (LBIST) Implementation with Spyglass validation at RTL level
- IEEE 1687 (IJTAG) Implementation at both Block and SoC levels
Post Silicon Debug and ATE Support
- Post-Silicon Debug & ATE Support including test program development and ATE board bring-up
- Testing Across Various Platforms like Advantest 93K for production-ready solutions